Boeckeler via-100 manual






















 · Via Boeckeler Video Image Marker System A (% similar) No manuals, no standard power cords, accessories, software etc are included unless pictured and noted in the description. All equipment is sold as is. Acquired from government surplus. No means to test further. We are surplus equipment dealers and do not have the ability or knowledge to (June 6th, )%(). BOECKELER VIA K VIDEO measurement system the VIA % enables an operator to perform horizontal x, vertical y, two dimensional Cy, diagonal point to point, circle radius and circumference and angle measurements.  · Boeckeler VIA; Selection File type icon File name Description Size Revision Time User; Ċ: www.doorway.ru


Boeckeler Instruments Inc. S. Butterfield Drive Tucson, AZ Ph. Fax www.doorway.ru Boeckeler introduces the VIA Windows-based image measuring, marking, archival and transmission software package. RMC Ultramicrotome PowerTome PT XL. R The PTXL model of the RMC PowerTome series. RMC PowerTomes - ultramicrotomes for the preparation of ultra- and semi-thin sections for electron microscopy with patented Power Drive ® technology. Mechanical stroke force particularly advantageous for cutting hard and large specimen. Anton Paar Tensile Stage TS The TS Tensile Stage is a completely new, advanced sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films. It is the first commercial sample stage specifically designed for in-situ XRD investigations of structural changes in materials under mechanical load.


The Boeckeler VIA measures X and Y dimensions. and enables an operator to perform horizontal (X), vertical (Y), two dimensional (XY), diagonal (point-to-point), circle (radius and circumference) and angle measurements. Separate X-axis and Y-axis calibration ensures accuracy for all measurements. Manuals and free owners instruction pdf guides. Find the user manual and the help you need for the products you own at ManualsOnline. BOECKELER VIA K VIDEO measurement system the VIA % enables an operator to perform horizontal x, vertical y, two dimensional Cy, diagonal point to point, circle radius and circumference and angle measurements.

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